Rigaku Smartlab Powder & Thin Film Diffractometer:
Available Analyses:
- Structural analysis of bulk solids, powders and thin films
- Modular optics design and automated alignment for changing between analysis techniques
- Phase identification with ICDD/PDF-2 and Rietveld refinement
Available Analyses:
- Bragg Brentano powder
- Parallel beam
- Grazing incidence for thin films
- X-ray reflectivity (XRR) for films 100 nm or less
- Small angle X-ray scattering (SAXS) for particle or pore size and distribution of nanoparticles and porous materials, both transmission and reflection modes
- In-situ heating up to 1100°C for all modes, non-ambient atmosphere or vacuum available
- In-plane diffraction to complement parallel beam data
- Phi attachment for in-plane sample rotation
- Ge(220) 2-bounce monochromator for discrimination of Cu-K-beta and X-ray fluorescence
- 10-sample stage
